Publications

AFM Group Led

A simple method for high yield fabrication of sharp silicon tips.
D. P. Burt, P. S. Dobson, L. Donaldson, J. M. R. Weaver,
Microelectronic Engineering, 2008, 85, 625-630

Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces.
P. S. Dobson, J. M. R. Weaver, D. P. Burt, M. N. Holder, N. R. Wilson, P. R. Unwin, J. V. Macpherson,
Physical Chemistry Chemical Physics, 2006, 8, 3909-3914

Microfabricated temperature standard based on Johnson noise measurement for the calibration of micro- and nano-thermometers.
P. S. Dobson, G. Mills, J. M. R. Weaver,
Review of Scientific Instruments, 2005, 76, art. 054901

Nanometer-scale gaps between metallic electrodes fabricated using a statistical alignment technique.
P. Steinmann, J. M. R. Weaver,
Applied Physics Letters, 2005, 86, art. 063104

Fabrication of sub-5 nm gaps between metallic electrodes using conventional lithographic techniques.
P. Steinmann, J. M. R. Weaver,
Journal of Vacuum Science and Technology B, 2004, 22, 3178-3181

Pattern transfer of a 23 nm-period grating and sub-15 nm dots into CVD diamond.
K. A. Lister, B. G. Casey, P. S. Dobson, S. Thoms, D. S. Macintyre, C. D. W. Wilkinson, J. M. R. Weaver,
Microelectronic Engineering, 2004, 73-74, 319-322

Fabrication of metallic tunnel junctions for the scanning single electron transistor atomic force microscope.
P. Steinmann, K. A. Lister, J. M. R. Weaver,
Journal of Vacuum Science and Technology B, 2003, 21, 2138-2141

Scanning Hall probe microscopy on an atomic force microscope tip.
B. K. Chong, H. Zhou, G. Mills, L. Donaldson, J. M. R. Weaver,
Journal of Vacuum Science and Technology A, 2001, 19, 1769-1772

Lithographically defined nano and micro sensors using "float coating"of resist and electron beam lithography.
H. Zhou, B. K. Chong, P. Stopford, G. Mills, A. Midha, L. Donaldson, J. M. R. Weaver,
Journal of Vacuum Science and Technology B, 2000, 18, 3594-3599

Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography.
H. Zhou, A. Midha, L. Bruchaus, G. Mills, L. Donaldson, J. M. R. Weaver,
Journal of Vacuum Science and Technology B, 1999, 17, 1954-1958

Scanning near-field optical spectroscopy and imaging using nanofabricated probes.
H. Zhou, A. Midha, G. Mills, L. Donaldson, J. M. R. Weaver,
Applied Physics Letters, 1999, 75, 1824-1826

Recent progress in the functionalization of atomic force microscope probes using electron-beam nanolithography.
H. Zhou, G. Mills, B. K. Chong, A. Midha, L. Donaldson, J. M. R. Weaver,
Journal of Vacuum Science and Technology A, 1999, 17, 2233-2239

Scanning thermal microscopy using batch fabricated thermocouple probes.
G. Mills, H. Zhou, A. Midha, L. Donaldson,J. M. R. Weaver,
Applied Physcis Letters, 1998, 72, 2900-2902

Generic scanned-probe microscope sensors by combined micromachining and electron-beam lithography.
H. Zhou, A. Midha, G. Mills, S. Thoms, S. K. Murad, J. M. R. Weaver,
Journal of Vacuum Scienec and Technology B, 1998, 16, 54-58

Anisotropic pattern transfer of fine resist features to silicon nitride via an intermediate titanium layer.
A. Midha, S. K. Murad, J. M. R. Weaver,
Microelectronic Engineering, 1997, 35, 99-102

Collaborator Led

SThM temperature mapping and nonlinear thermal resistance evolution with bias on AlGaN/GaN HEMT devices.
R. Aubry, J. C. Jacquet, J. Weaver, O. Durand, P. Dobson, G. Mills, M. A. di Forte-Poisson, S. Cassette, S. L. Delage,
IEEE Transactions on Electron Devices, 2007, 54, 385-390

Nanowire probes for high resolution combined scanning electrochemical Microscopy - Atomic force Microscopy.
D. P. Burt, N. R. Wilson, J. M. R. Weaver, P. S. Dobson, J. V. Macpherson,
Nano Letters, 2005, 5, 639-643

Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes.
P. S. Dobson, J. M. R. Weaver, M. N. Holder, P. R. Unwin, J. V. Macpherson,
Analytical Chemistry, 2005, 77, 424-434

Two new microscopical variants of thermomechanical modulation: scanning thermal expansion microscopy and dynamic localized thermomechanical analysis.
A. Hammiche, D. M. Price, E. Dupas, G. Mills, A. Kulik, M. Reading, J. M. R. Weaver, H. M. Pollock,
Journal of Microscopy-Oxford, 2000, 199, 180-190

Highly localized thermal, mechanical, and spectroscopic characterization of polymers using miniaturized thermal probes.
A. Hammiche, L. Bozec, M. Conroy, H. M. Pollock, G. Mills, J. M. R. Weaver, D. M. Price, M. Reading, D. J. Hourston, M. Song,
Journal of Vacuum Science and Technology B, 2000, 18, 1322-1332

Detection of subsurface voids using scanning thermal microscopy.
G. Mills, J. M. R. Weaver, G. Harris, W. Chen, J. Carrejo, L. Johnson, B. Rogers,
Ultramicroscopy, 1999, 80, 7-11